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#	Item
261	How to overcome/avoid High Frequency Effects on Debug Interfaces – Trace Port Design Guidelines An On-Chip Debugger/Analyzer (OCD) like iSYSTEM’s iC5000 (Figure 1) acts as a link to the target hardware by standard de Add to Reading List Source URL: www.isystem.com Language: English - Date: 2012-04-30 12:22:02 Electronics manufacturing IEEE standards Electronic test equipment Electronic design automation Signal integrity Oscilloscope Joint Test Action Group Printed circuit board Nexus Electronics Electronic engineering Technology
262	698 IEEE TRANSACTIONS ON ROBOTICS, VOL. 24, NO. 3, JUNE 2008 Design and Development of the Lifting and Propulsion Mechanism for a Biologically Add to Reading List Source URL: www.societyofrobots.com Language: English - Date: 2012-12-02 12:41:09 Basiliscus Legged robot Mobile robot Linkage Metin Sitti Running Common basilisk Mechanical engineering Locomotion Robot
263	170 IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 15, NO. 2, APRIL 2010 Design, Fabrication, and Testing of a Capsule With Hybrid Locomotion for Gastrointestinal Add to Reading List Source URL: www.iris.sssup.it Language: English - Date: 2014-12-23 16:45:45 Endoscopy Capsule endoscopy Magnet Enteroscopy Neodymium magnet Electric motor Given Imaging Gear Electromagnetism Physics Magnetism
264	IEEE TRANSACTION ON COMPUTERS, SPECIAL SECTION ON COMPUTATIONAL SUSTAINABILITY 1 Incentive Mechanisms for Community Sensing Boi Faltings, Jason Jingshi Li, Radu Jurca Add to Reading List Source URL: liawww.epfl.ch Language: English - Date: 2013-08-22 04:33:41 Game theory Mechanism design Social choice theory Kullback–Leibler divergence Affect Valuation P-value Scoring rule Statistics Statistical theory Probability and statistics
265	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2014-04-10 12:02:07 Electronics IEEE standards Embedded systems Joint Test Action Group Boundary scan OnTap Design for testing Field-programmable gate array Berkeley Software Distribution Electronics manufacturing Manufacturing Electronic engineering
266	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2014-04-07 15:03:40 Electronic engineering Manufacturing IEEE standards Joint Test Action Group Electronic design automation Boundary scan ProScan Wiggler DTS Electronics Embedded systems Electronics manufacturing
267	This article has been accepted for inclusion in a future issue of this journal. Content is final as presented, with the exception of pagination. IEEE/ACM TRANSACTIONS ON NETWORKING 1 ILP Formulations for p-Cycle Design Add to Reading List Source URL: www.eee.hku.hk Language: English - Date: 2010-01-15 05:37:40 Topology Mathematics Theoretical computer science Applied mathematics Constraint programming Network flow Network topology Flow network
268	Real-time Trace Reconstruction (RTR) Add to Reading List Source URL: www.isystem.com Language: English - Date: 2012-04-30 12:21:14 Embedded systems Debugging Central processing unit IEEE standards Microprocessors Nexus Microcontroller CPU design Emulator Electronics Electronic engineering Computing
269	from the editor E d i t o r- i n - c h i e f : S t e v e M c C o n n e l l , C o n s t r u x S o f t w a r e , s o f t w a r e @ c o n s t r u x . c o m The Best Influences on Software Engineering Add to Reading List Source URL: www.stevemcconnell.com Language: English - Date: 2007-03-02 18:19:01 Software development process Barry Boehm Capability Maturity Model COBOL Software quality Software design Software development methodology Software engineer IEEE Software Computing Software development Software engineering
270	614 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 38, NO. 4, APRIL 2003 Jitter Transfer Characteristics of Delay-Locked Loops—Theories and Design Techniques Add to Reading List Source URL: cva.stanford.edu Language: English - Date: 2005-12-01 13:38:05 Oscillators Jitter Phase-locked loop Phase noise Delay-locked loop Clock recovery Injection locking Phase detector Frequency synthesizer Electronic engineering Electronics Electromagnetism

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